Using EM/IR Analysis for Efinix FPGAs

Using EM/IR Analysis for Efinix FPGAs
by Daniel Payne on 05-30-2022 at 10:00 am

XLR min

I’ve been following the EM/IR (Electro-Migration, IR is current and resistance) analysis market for many years now, and recently attended a presentation from Steven Chin, Sr. Director IC Engineering of Efinix, at the User2User event organized by Siemens EDA. The Tuesday presentation was in the morning at the Marriott… Read More


Electromigration and IR Drop Analysis has a New Entrant

Electromigration and IR Drop Analysis has a New Entrant
by Daniel Payne on 09-28-2021 at 9:00 am

mPower capacity

My first IR drop analysis was back in the early 1980s at Intel, where I had to manually model the parasitics of the VDD and VSS interconnect for all of the IO cells that our team was designing in a graphics chip, then I ran that netlist in a SPICE simulator using transient analysis, measuring the bounce in VSS and droop in VDD levels as all… Read More


Automating the Analysis of Power MOSFET Designs

Automating the Analysis of Power MOSFET Designs
by Daniel Payne on 06-04-2020 at 10:00 am

ventilator

There’s a world of difference between our smart phones that are battery powered and pack billions of transistors, and power MOSFET devices that can be used in industrial applications, telecom, cloud computing and automotive where they could be run at a few hundred volts and up to 80A of current. I’ve read about one … Read More