I arrived for my #60DAC booth appointment at Empyrean and was able to watch a customer presentation from Jason Guo, of Diodes. Jason was talking about how his company used the Patron tool for EM/IR analysis on their automotive chips. Diodes was found back in 1959 at Plano, Texas, and has since grown into 32 locations around the globe,… Read More
I’ve watched the SPICE market segment into multiple approaches, like: Classic SPICE, Parallel SPICE, FastSPICE and Analog FastSPICE. In a similar fashion the same thing just happened to EM/IR analysis, because after years of waiting we finally have a different approach to EM/IR analysis that works at the top-level of … Read More
I’ve been following the EM/IR (Electro-Migration, IR is current and resistance) analysis market for many years now, and recently attended a presentation from Steven Chin, Sr. Director IC Engineering of Efinix, at the User2User event organized by Siemens EDA. The Tuesday presentation was in the morning at the Marriott… Read More
My first IR drop analysis was back in the early 1980s at Intel, where I had to manually model the parasitics of the VDD and VSS interconnect for all of the IO cells that our team was designing in a graphics chip, then I ran that netlist in a SPICE simulator using transient analysis, measuring the bounce in VSS and droop in VDD levels as all… Read More
There’s a world of difference between our smart phones that are battery powered and pack billions of transistors, and power MOSFET devices that can be used in industrial applications, telecom, cloud computing and automotive where they could be run at a few hundred volts and up to 80A of current. I’ve read about one … Read More
