Automating Complex Circuit Checking Tasks

Automating Complex Circuit Checking Tasks
by SStalnaker on 09-20-2012 at 7:24 pm

By Hend Wagieh, Mentor Graphics

At advanced IC technology nodes, circuit designers are now encountering problems such as reduced voltage supply headroom, increased wiring parasitic resistance (Rp) and capacitance (Cp), more restrictive electromigration (EM) rules, latch-up, and electrostatic discharge (ESD) damage,… Read More


IC Custom IP Blocks – EM and IR Drop Effects

IC Custom IP Blocks – EM and IR Drop Effects
by Daniel Payne on 03-06-2012 at 5:33 pm

Designing custom IP blocks is a challenge at the transistor-level and I wanted to learn what the recommended methodology and EDA tool flow was at Synopsys. They have a webinar that you can register for and it takes 30 minutes to learn what they have to say, or you can read a White Paper. If you cannot spare that much time, then my summary… Read More