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In my last article I talked about the physical design aspect of 3D-IC. Now looking at its verification aspect, it spans through a wide spectrum of test at hardware as well as software level. The verification challenge goes much beyond that of a SoC which is at a single plane. Even a typical SoC that comprises of a processor core, memory… Read More
Design for test at RTLby Paul McLellan on 07-10-2011 at 3:09 pmCategories: EDA
Design for test (DFT) imposes various restrictions on the design so that the test automation tools (automatic test pattern approaches such as scan, as well as built-in self-test approaches) will subsequently be able to generate the test program. For example, different test approaches impose constraints on clock generation… Read More
