Mentor Tessent MissionMode Provides Runtime DFT for Self-Correcting Automotive ICs

Mentor Tessent MissionMode Provides Runtime DFT for Self-Correcting Automotive ICs
by Mitch Heins on 02-22-2018 at 12:00 pm

The automotive industry continues push the limits on how “smart” we can make our vehicles and from that, it follows as to how smart we can make the electronics in the vehicles. When I think of smart cars (and smart automotive ICs) I typically think of things like advanced driver-assistance systems (ADAS) that use AI and neural networks… Read More


Mentor Tessent Products Ready for Second Edition of ISO 26262 Coming in March 2018

Mentor Tessent Products Ready for Second Edition of ISO 26262 Coming in March 2018
by Mitch Heins on 01-17-2018 at 7:00 am

Have you notice how smart your automobile is getting? Watching the first round of NFL playoffs I lost count on the number of TV commercials showing cars weaving through tight construction zones (and Star Wars figures), big trucks parking in incredibly tight spaces, cars avoiding rear-end collisions and pedestrians, and even … Read More


Design for test at RTL

Design for test at RTL
by Paul McLellan on 07-10-2011 at 3:09 pm

Design for test (DFT) imposes various restrictions on the design so that the test automation tools (automatic test pattern approaches such as scan, as well as built-in self-test approaches) will subsequently be able to generate the test program. For example, different test approaches impose constraints on clock generation… Read More