Patterns looking inside, not just between, logic cells

Patterns looking inside, not just between, logic cells
by Don Dingee on 12-27-2013 at 5:00 pm

Traditional logic testing relies on blasting pattern after pattern at the inputs, trying to exercise combinations to shake faults out of logic and hopefully have them manifested at an observable pin, be it a test point or a final output stage. It’s a remarkably inefficient process with a lot of randomness and luck involved.

Getting… Read More


10 years, 100,000 miles, or <1 DPM

10 years, 100,000 miles, or <1 DPM
by Don Dingee on 05-30-2013 at 10:00 pm

Auto makers have historically been accused of things like planned obsolescence – redesigning parts to make repairs painfully or even prohibitively expensive – and the “warranty time-bomb”, where major systems seem to fail about a week after the warranty expires. Optimists would chalk both those up to relentless innovation,… Read More