Improve Test Robustness & Coverage Early in Design

Improve Test Robustness & Coverage Early in Design
by Pawan Fangaria on 11-03-2014 at 5:00 pm

In a semiconductor design, keeping the design testable with high test coverage has always been a requirement. However with shrinking technology nodes and large, dense SoC designs and complex logic structures, while it has become mandatory to reach close to 100% test coverage, it’s extremely difficult to cope with the explosion… Read More


Ceaseless Field Test for Safety Critical Devices

Ceaseless Field Test for Safety Critical Devices
by Pawan Fangaria on 06-03-2014 at 3:00 am

While focus of the semiconductor industry has shifted to DACin this week and unfortunately I couldn’t attend due to some of my management exams, in my spare time I was browsing through some of the webpages of Cadenceto check their new offerings (although they have a great list of items to showcase at DAC) and to my pleasure I came across… Read More


The logic of trusting FPGAs through DO-254

The logic of trusting FPGAs through DO-254
by Don Dingee on 11-13-2012 at 8:15 pm

Any doubters of the importance of FPGA technology to the defense/aerospace industry should consider this: each Airbus A380 has over 1000 Microsemi FPGAs on board. That is a staggering figure, especially considering the FAA doesn’t trust FPGAs, or the code that goes into them.… Read More