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What is Different About Synopsys’ Comprehensive, Scalable Solution for Fast Heterogeneous Integration

What is Different About Synopsys’ Comprehensive, Scalable Solution for Fast Heterogeneous Integration
by Mike Gianfagna on 02-03-2025 at 10:00 am

What is Different About Synopsys’ Comprehensive, Scalable Solution for Fast Heterogeneous Integration

Multi-die design has become the center of a lot of conversation lately. The ability to integrate multiple heterogeneous devices into a single package has changed the semiconductor landscape, permanently. This technology has opened a path for continued Moore’s Law scaling at the system level. What comes next will truly be exciting.… Read More


Will 50% of New High Performance Computing (HPC) Chip Designs be Multi-Die in 2025?

Will 50% of New High Performance Computing (HPC) Chip Designs be Multi-Die in 2025?
by Kalar Rajendiran on 01-28-2025 at 6:00 am

Synopsys Predictions for Multi Die Designs in 2025

Predictions in technology adoption often hinge on a delicate balance between technical feasibility and market dynamics. While business considerations play a pivotal role, the technical category reasons for the success or failure of a prediction are more tangible and often easier to identify—if scrutinized with care. However,… Read More


A Deep Dive into SoC Performance Analysis: Optimizing SoC Design Performance Via Hardware-Assisted Verification Platforms

A Deep Dive into SoC Performance Analysis: Optimizing SoC Design Performance Via Hardware-Assisted Verification Platforms
by Lauro Rizzatti on 01-22-2025 at 10:00 am

A Deep Dive into SoC Performance Analysis Part 2 Figure 1

Part 2 of 2 – Performance Validation Across Hardware Blocks and Firmware in SoC Designs

Part 2 explores the performance validation process across hardware blocks and firmware in System-on-Chip (SoC) designs, emphasizing the critical role of Hardware-Assisted Verification (HAV) platforms. It outlines the validation workflowRead More


A Deep Dive into SoC Performance Analysis: What, Why, and How

A Deep Dive into SoC Performance Analysis: What, Why, and How
by Lauro Rizzatti on 01-15-2025 at 6:00 am

A Deep Dive into SoC Performance Analysis Part 1 Figure 2

Part 1 of 2 – Essential Performance Metrics to Validate SoC Performance Analysis

Part 1 provides an overview of the key performance metrics across three foundational blocks of System-on-Chip (SoC) designs that are vital for success in the rapidly evolving semiconductor industry and presents a holistic approach to optimizeRead More


Synopsys Brings Multi-Die Integration Closer with its 3DIO IP Solution and 3DIC Tools

Synopsys Brings Multi-Die Integration Closer with its 3DIO IP Solution and 3DIC Tools
by Mike Gianfagna on 12-10-2024 at 6:00 am

Synopsys Brings Multi Die Integration Closer with its 3DIO IP Solution and 3DIC Tools

There is ample evidence that technologies such as high-performance computing, next-generation servers, and AI accelerators are fueling unprecedented demands in data processing speed with massive data storage, lower latency, and lower power. Heterogeneous system integration, more commonly called 2.5 and 3D IC design, … Read More


Enhancing System Reliability with Digital Twins and Silicon Lifecycle Management (SLM)

Enhancing System Reliability with Digital Twins and Silicon Lifecycle Management (SLM)
by Kalar Rajendiran on 12-09-2024 at 6:00 am

Synopsys SLM Solution Components

As industries become more reliant on advanced technologies, the importance of ensuring the reliability and longevity of critical systems grows. Failures in components, whether in autonomous vehicles, high performance computing (HPC), healthcare devices, or industrial automation, can have far-reaching consequences.… Read More


A Master Class with Ansys and Synopsys, The Latest Advances in Multi-Die Design

A Master Class with Ansys and Synopsys, The Latest Advances in Multi-Die Design
by Mike Gianfagna on 12-04-2024 at 6:00 am

A Master Class with Ansys and Synopsys, The Latest Advances in Multi Die Design

2.5D and 3D multi-die design is rapidly moving into the mainstream for many applications. HPC, GPU, mobile, and AI/ML are application areas that have seen real benefits. The concept of “mix/match” for chips and chiplets to form a complex system sounds deceptively simple. In fact, the implementation and analysis techniques required… Read More


The Immensity of Software Development and the Challenges of Debugging Series (Part 4 of 4)

The Immensity of Software Development and the Challenges of Debugging Series (Part 4 of 4)
by Lauro Rizzatti on 11-19-2024 at 10:00 am

Immensity of SW development Part 4 Table 1

The Impact of AI on Software and Hardware Development

Part 4 of this series analyzes how AI algorithmic processing is transforming software structures and significantly modifying processing hardware. It explores the marginalization of the traditional CPU architecture and demonstrates how software is increasingly dominatingRead More


Synopsys-Ansys 2.5D/3D Multi-Die Design Update: Learning from the Early Adopters

Synopsys-Ansys 2.5D/3D Multi-Die Design Update: Learning from the Early Adopters
by Daniel Nenni on 11-06-2024 at 10:00 am

banner for webinar

The demand for high-performance computing (HPC), data centers, and AI-driven applications has fueled the rise of 2.5D and 3D multi-die designs, offering superior performance, power efficiency, and packaging density. However, these benefits come with myriads of challenges, such as multi-physics, which need to be addressed.… Read More


The Immensity of Software Development and the Challenges of Debugging (Part 3 of 4)

The Immensity of Software Development and the Challenges of Debugging (Part 3 of 4)
by Lauro Rizzatti on 10-03-2024 at 10:00 am

Immensity of SW development Part 3 Figure 1

Part 3 of this 4-part series analyzes methods and tools involved in debugging software at different layers of the software stack.

Software debugging involves identifying and resolving issues ranging from functional misbehaviors to crashes. The essential requirement for validating software programs is the ability to monitor… Read More