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Synopsys AMD 5 21 25 Webinar 800x100 High Quality
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SNUG 2025: A Watershed Moment for EDA – Part 2

SNUG 2025: A Watershed Moment for EDA – Part 2
by Lauro Rizzatti on 05-01-2025 at 6:00 am

SNUG 2025 Scaling Compute for the Age of Intelligence Figure 1

At this year’s SNUG (Synopsys Users Group) conference, Richard Ho, Head of Hardware, OpenAI, delivered the second keynote, titled “Scaling Compute for the Age of Intelligence.” In his presentation, Richard guided the audience through the transformative trends and implications of the intelligence era now unfolding before… Read More


Automotive Functional Safety (FuSa) Challenges

Automotive Functional Safety (FuSa) Challenges
by Daniel Payne on 04-29-2025 at 10:00 am

silicon lifecycle management slm diagram min

Modern vehicles have become quite sophisticated, like a supercomputer on wheels. They integrate a vast number of electronic components, including thousands of chips, to deliver advanced functionalities ranging from infotainment to critical safety systems. This increasing complexity necessitates a robust approach to … Read More


Scaling AI Infrastructure with Next-Gen Interconnects

Scaling AI Infrastructure with Next-Gen Interconnects
by Kalar Rajendiran on 04-29-2025 at 6:00 am

Data Centers Reimagined for Future of Gen AI

At the recent IPSoC Conference in Silicon Valley, Aparna Tarde gave a talk on the importance of Next-Gen Interconnects to scale AI infrastructure. Aparna is a Sr. Technical Product Manager at Synopsys. A synthesis of the salient points from her talk follows.

The rapid advancement of artificial intelligence (AI) is fundamentally… Read More


The Growing Importance of PVT Monitoring for Silicon Lifecycle Management

The Growing Importance of PVT Monitoring for Silicon Lifecycle Management
by Kalar Rajendiran on 04-24-2025 at 6:00 am

SLM IP Target Applications

In an era defined by complex chip architectures, ever-shrinking technology nodes and very demanding applications, Silicon Lifecycle Management (SLM) has become a foundational strategy for optimizing performance, reliability, and efficiency across the lifespan of a semiconductor device. Central to effective SLM are Process,… Read More


Achieving Seamless 1.6 Tbps Interoperability for High BW HPC AI/ML SoCs: A Technical Webinar with Samtec and Synopsys

Achieving Seamless 1.6 Tbps Interoperability for High BW HPC AI/ML SoCs: A Technical Webinar with Samtec and Synopsys
by Daniel Nenni on 04-17-2025 at 10:00 am

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HPC Bandwidth Explosion and 1.6T Ecosystem Interop Need

The exponential growth in data bandwidth requirements driven by HPC systems, AI, and ML applications has set the stage for an ever-increasing need for 1.6Tbps Ethernet. As data centers strive to manage vast data transfers with maximum efficiency, the urgency for interoperability… Read More


SNUG 2025: A Watershed Moment for EDA – Part 1

SNUG 2025: A Watershed Moment for EDA – Part 1
by Lauro Rizzatti on 04-15-2025 at 6:00 am

SNUG 2025 A Watershed Moment for EDA Figure 1

Hot on the heels of DVConUS 2025, the 35th annual Synopsys User Group (SNUG) Conference made its mark as a defining moment in the evolution of Synopsys—and the broader electronic design automation (EDA) industry. This year’s milestone event not only underscored Synopsys’ continued innovation but also affirmed the vision… Read More


Synopsys Webinar: The Importance of Security in Multi-Die Designs – Navigating the Complex Landscape

Synopsys Webinar: The Importance of Security in Multi-Die Designs – Navigating the Complex Landscape
by Daniel Nenni on 04-11-2025 at 6:00 am

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In today’s rapidly evolving digital landscape, the security of electronic systems is of the highest priority. This importance is underscored by technological advancements and increasing regulatory demands. Multi-die designs which integrate multiple dies (also called chiplets) into a single package, introduce … Read More


Synopsys Executive Forum: Driving Silicon and Systems Engineering Innovation

Synopsys Executive Forum: Driving Silicon and Systems Engineering Innovation
by Kalar Rajendiran on 04-09-2025 at 10:00 am

Sassine Keynote (with Satya)

The annual SNUG (Synopsys Users Group) conference, now in its 35th year, once again brought together key stakeholders to showcase accomplishments, discuss challenges, and explore opportunities within the semiconductor and electronics industry. With approximately 2,500 attendees, SNUG 2025 served as a dynamic hub for collaboration… Read More


Evolution of Memory Test and Repair: From Silicon Design to AI-Driven Architectures

Evolution of Memory Test and Repair: From Silicon Design to AI-Driven Architectures
by Kalar Rajendiran on 04-01-2025 at 6:00 am

STAR Memory System (SMS) Solution

Memory testing in the early days of computing was a relatively straightforward process. Designers relied on simple, deterministic approaches to verify the functionality of memory modules. However, as memory density increased and systems became more complex, the likelihood of faults also rose. With advancements in memory… Read More


DVCon 2025: AI and the Future of Verification Take Center Stage

DVCon 2025: AI and the Future of Verification Take Center Stage
by Lauro Rizzatti on 03-06-2025 at 10:00 am

DVCon 2025

The 2025 Design and Verification Conference (DVCon) was a four-day event packed with insightful discussions, cutting-edge technology showcases, and thought-provoking debates. The conference agenda included a rich mix of tutorial sessions, a keynote presentation, a panel discussion, and an exhibit hall with Electronic… Read More