MIPI in the Car – Transport From Sensors to Compute

MIPI in the Car – Transport From Sensors to Compute
by Bernard Murphy on 11-09-2022 at 6:00 am

NXP Camera subsystem min

I’ve written on and off about sensors, ML inference of the output of those sensors and the application of both in modern cars. Neither ADAS nor autonomous/semi-autonomous driving would be possible without these. But until now I have never covered the transport between sensors and the compute that safely turns what they produce… Read More


VeriSilicon’s AI-ISP Breaks the Limits of Traditional Computer Vision Technologies

VeriSilicon’s AI-ISP Breaks the Limits of Traditional Computer Vision Technologies
by Kalar Rajendiran on 10-13-2022 at 10:00 am

VeriSilicons NPU Offerings

The tremendous growth in edge devices has focused the spotlight on Edge-AI processing for low latency, low power and low-DDR bandwidth compute needs. Many of these Edge-AI applications depend on effective and efficient processing of image and video streams which in turn relies on computer vision technology. In early September,… Read More


WEBINAR: Flash Memory as a Root of Trust

WEBINAR: Flash Memory as a Root of Trust
by Bernard Murphy on 10-09-2022 at 4:00 pm

secure flash

It should not come as a surprise that the vast majority of IoT devices are insecure. As an indication, one survey estimates that 98% of IoT traffic is unencrypted. It’s not hard to understand why. Many such devices are cost-sensitive, designing security into a product is hard, buyers aren’t prepared to pay a premium for security … Read More


Siemens EDA Discuss Permanent and Transient Faults

Siemens EDA Discuss Permanent and Transient Faults
by Bernard Murphy on 10-05-2022 at 6:00 am

wafer image min

This is a topic worth coverage for those of us who aim to know more about safety. There are devils in the details on how ISO 26262 quantifies fault metrics, where I consider my understanding probably similar to other non-experts: light. All in all, a nice summary of the topic.

Permanent and transient faults 101

The authors kick off … Read More


Verifying 10+ Billion-Gate Designs Requires Distinct, Scalable Hardware Emulation Architecture

Verifying 10+ Billion-Gate Designs Requires Distinct, Scalable Hardware Emulation Architecture
by Daniel Nenni on 08-29-2022 at 6:00 am

960 x 540 Veloce

In a two-part series, Lauro Rizzatti examines why three kinds of hardware-assisted verification engines are a must have for today’s semiconductor designs. To do so, he interviewed Siemens EDA’s Vijay Chobisa and Juergen Jaeger to learn more about the Veloce hardware-assisted verification systems.

What follows is part one,… Read More


DSP IP for High Performance Sensor Fusion on an Embedded Budget

DSP IP for High Performance Sensor Fusion on an Embedded Budget
by Kalar Rajendiran on 08-04-2022 at 6:00 am

VPX Vector DSP Core Data Types

Whether we realize it or not, everyday applications we use depend on data gathered by sensors. We can bet that pretty much every application uses at least a couple of different types of sensors, if not more. That is because different types of sensors are better suited to collect data depending on the application, the environment … Read More


Scalability – A Looming Problem in Safety Analysis

Scalability – A Looming Problem in Safety Analysis
by Stefano Lorenzini on 07-28-2022 at 6:00 am

Figure 2 FMEDA white paper

Scalability – A Looming Problem in Safety Analysis

The boundless possibilities of automation in cars and other vehicles have captivated designers to the point that electronic content is now a stronger driver of differentiation than any other factor. It accounts for a substantial fraction of material cost in any of these vehicles.… Read More


Can We Auto-Generate Complete RTL, SVA, UVM Testbench, C/C++ Driver Code, and Documentation for Entire IP Blocks?

Can We Auto-Generate Complete RTL, SVA, UVM Testbench, C/C++ Driver Code, and Documentation for Entire IP Blocks?
by Kalar Rajendiran on 07-11-2022 at 6:00 am

IDSNG1

Whether it is fully autonomous driving, or wrinkle-free fabric, or ambient energy harvesting for powering electronic devices, each industry is chasing after its respective ultimate goal. For the semiconductor design industry, its goal is the capability to generate complete chip or IP in executable format from a high-level… Read More


Accellera Update: CDC, Safety and AMS

Accellera Update: CDC, Safety and AMS
by Bernard Murphy on 07-06-2022 at 6:00 am

logo accellera min

I recently had an update from Lu Dai, Chairman of Accellera, also Sr. Director of Engineering at Qualcomm. He’s always a pleasure to talk to, in this instance giving me a capsule summary of status in 3 areas that interested me: CDC, Functional Safety and AMS. I will start with CDC, a new proposed working group in Accellera. To manage… Read More


TSMC 2022 Technology Symposium Review – Process Technology Development

TSMC 2022 Technology Symposium Review – Process Technology Development
by Tom Dillinger on 06-22-2022 at 5:00 am

finFLEX

TSMC recently held their annual Technology Symposium in Santa Clara, CA.  The presentations provided a comprehensive overview of their status and upcoming roadmap, covering all facets of process technology and advanced packaging development.  This article will summarize the highlights of the process technology updates… Read More