Patterns looking inside, not just between, logic cells

Patterns looking inside, not just between, logic cells
by Don Dingee on 12-27-2013 at 5:00 pm

Traditional logic testing relies on blasting pattern after pattern at the inputs, trying to exercise combinations to shake faults out of logic and hopefully have them manifested at an observable pin, be it a test point or a final output stage. It’s a remarkably inefficient process with a lot of randomness and luck involved.

Getting… Read More