Podcast EP200: Dan and Mike’s Top Ten List For the Semiconductor Industry

Podcast EP200: Dan and Mike’s Top Ten List For the Semiconductor Industry
by Daniel Nenni on 12-29-2023 at 10:00 am

Dan is joined by podcast producer and collaborator Mike Gianfagna for Semiconductor Insiders episode 200. Dan and Mike look over the past two years (and 200 podcasts) to develop a top ten list of changes and innovation in the semiconductor industry. There is a lot of back-story detail on each topic in this far-reaching discussion.… Read More


Preventing SOC Schedule Delays Using the Cloud

Preventing SOC Schedule Delays Using the Cloud
by Ronen Laviv on 12-25-2023 at 6:00 am

compute peaks 1

In my previous article, we touched on ways to pull in the schedule. This time I’d like to analyze how peak usage affects project timeline and cost. The above graph is based on real pattern taken from one development week in Annapurna Labs 5nm Graviton.

The Graph shows the number of variable servers per hour per day. There’s a baseline… Read More


2024 Signal & Power Integrity (SIPI) SIG Event

2024 Signal & Power Integrity (SIPI) SIG Event
by Admin on 12-18-2023 at 7:56 pm

What is SIPI SIG?

The Synopsys SIPI SIG Event is for Synopsys customers to hear the latest advances and solutions in signal and power integrity from customers and partners. This event provides the opportunity for networking and  discussion with fellow SIPI engineers to increase awareness of signal and power integrity issues

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RISC-V and Chiplets: A Panel Discussion

RISC-V and Chiplets: A Panel Discussion
by Paul McLellan on 12-13-2023 at 10:00 am

rvnames

At the recent RISC-V Summit, the very last session was a panel about chiplets called Chiplets in the RISC-V Ecosystem. It was moderated by Calista Redmond, the CEO of RISC-V International. The panelists were:

  • Laurent Moll, COO of Arteris
  • Aniket Saha, VP of Product Management of Tenstorrent
  • Dale Greenley, VP of Engineering of Ventana
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Automated Constraints Promotion Methodology for IP to Complex SoC Designs

Automated Constraints Promotion Methodology for IP to Complex SoC Designs
by Kalar Rajendiran on 12-12-2023 at 6:00 am

Synopsys Timing Constraints Manager

In the world of semiconductor design, constraints are essentially specifications and requirements that guide the implementation of a specific hardware or software component within a larger system. They dictate timing, area, power, performance, and of course functionality of a design, playing a crucial role in ensuring that… Read More


UCIe InterOp Testchip Unleashes Growth of Open Chiplet Ecosystem

UCIe InterOp Testchip Unleashes Growth of Open Chiplet Ecosystem
by Kalar Rajendiran on 12-11-2023 at 6:00 am

Pike Creek UCIe Test chip

Intel recently made headlines when CEO Pat Gelsinger unveiled the world’s first UCIe interoperability test chip demo at Innovation 2023. The test chip built using advanced packaging technology is codenamed Pike Creek and is used to demonstrate interoperability across chiplets designed by Intel and Synopsys. More details … Read More


Synopsys 224G SerDes IP’s Extensive Ecosystem Interoperability

Synopsys 224G SerDes IP’s Extensive Ecosystem Interoperability
by Kalar Rajendiran on 11-27-2023 at 6:00 am

Synopsys 224G SerDes IP InterOp Multiple Tradeshows

Hyperscale data centers are evolving rapidly to meet the demands of high-bandwidth, low-latency applications, ranging from AI and high-performance computing (HPC) to telecommunications and 4K video streaming. The increasing need for faster data transfer rates has prompted a scaling of Ethernet from 51Tb/s to 100Tb/s. Numerous… Read More


Webinar: Making the Right Connections – Taking the Guess Work out of DFT Connectivity Validation

Webinar: Making the Right Connections – Taking the Guess Work out of DFT Connectivity Validation
by Admin on 11-15-2023 at 1:51 pm

Synopsys Webinar: Tuesday, November 28, 2023 | 10-11 am. PT

System-on-Chip (SoC) designs continue to grow in both size and complexity in order to meet the ever-growing performance and power demands associated with modern technology. To keep up with this fast-paced evolution, the corresponding design-for-test (DFT) logic

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