Part 1 of 2 – Essential Performance Metrics to Validate SoC Performance Analysis
Part 1 provides an overview of the key performance metrics across three foundational blocks of System-on-Chip (SoC) designs that are vital for success in the rapidly evolving semiconductor industry and presents a holistic approach to optimize… Read More
As industries become more reliant on advanced technologies, the importance of ensuring the reliability and longevity of critical systems grows. Failures in components, whether in autonomous vehicles, high performance computing (HPC), healthcare devices, or industrial automation, can have far-reaching consequences.… Read More
When contemplating the Lego-like hardware and software structure of a leading system-on-chip (SoC) design, a mathematically inclined mind might marvel at the tantalizing array of combinatorial possibilities among its hardware and software components. In contrast, the engineering team tasked with its validation may have… Read More
The demand for high-performance computing (HPC), data centers, and AI-driven applications has fueled the rise of 2.5D and 3D multi-die designs, offering superior performance, power efficiency, and packaging density. However, these benefits come with myriads of challenges, such as multi-physics, which need to be addressed.… Read More
With the increasing complexity and importance of memories in modern ICs, there is a clear need for specialized tools and techniques for the design and verification of embedded memory blocks. Traditional methods like SPICE simulation and cell-based formal verification have limitations; SPICE offers circuit-level accuracy
The semiconductor industry is rapidly adopting 2.5D and 3D multi-die designs as the significant benefits have become clear for applications like HPC, GPU, mobile, and AI/ML. Multi-die design technology has been quickly evolving with early experiences leading to the development of more advanced implementation and analysis… Read More
For this year’s event, we are excited to be discussing the latest in optical design and simulation, including topics on image simulation with the entire image chain, freeform optics, display technnology, high-performance computing for photonic devices, and other
Learn the latest on Synopsys’ optical scattering measurement solutions.
During the event, you will have the opportunity to network with Synopsys experts, listen to technical talks, and see several demonstrations of our scattering measurement equipment
Morning
Topics include:
All members of the design and test community are invited to register to attend Synopsys’ 30th Annual Test & SLM Special Interest Group (SIG) at the 2024 International Test Conference (ITC).
The event will host experts from leading companies who will share how Synopsys Test and SLM solutions including AI-driven test, distributed… Read More
