Optimizing Prototype Debug

Optimizing Prototype Debug
by Bernard Murphy on 11-09-2016 at 7:00 am

In the spectrum of functional verification platforms – software-based simulation, emulation and FPGA-based Image Removedprototyping – it is generally agreed that while speed shoots up by orders of magnitude (going left to right) ease of debug drops as performance rises and setup time increases rapidly, from close to nothing… Read More


Improve Test Robustness & Coverage Early in Design

Improve Test Robustness & Coverage Early in Design
by Pawan Fangaria on 11-03-2014 at 5:00 pm

In a semiconductor design, keeping the design testable with high test coverage has always been a requirement. However with shrinking technology nodes and large, dense SoC designs and complex logic structures, while it has become mandatory to reach close to 100% test coverage, it’s extremely difficult to cope with the explosion… Read More