How should we assess the risk of harmful metastability in a clock domain crossing (CDC) when the semiconductor process has significant parameter variability? One possibility is to determine the MTBF of a synchronizer at the worst-case corner of the CDC. But that approach has some conflicting complications:
As an example of the need for real-world reliability metrics, consider a modern automobile. We can already buy a car with parking assistance, collision avoidance, autonomous braking and adaptive cruise control features. These new features depend on video image processing that requires high-performance SoC components where… Read More
Estimating the MTBF of an SoC should always include an analysis of synchronizer reliability. Contemporary process nodes are introducing new challenges to the reliability of clock domain crossings so it is prudent to revisit how your simulation tool calculates a synchronizer’s MTBF. Let’s list the ten most common pitfalls.… Read More
