The headline is: Ansys Signs Definitive Agreement to Acquire Diakopto, Expands Multiphysics Simulation Portfolio for Semiconductor Designers. The acquisition complements Ansys’ existing signoff solutions and enables integrated circuit (IC) designers to detect problems earlier in the design flow.
Which is certainly… Read More
Resistance checks between ESD diode cells and pads or power clamps, and current density analysis for such current flows are commonly used for ESD networks verification [1]. When such simulations use standard post-layout netlists generated by parasitic extraction tools, the calculated resistances may be dramatically higher… Read More
This Diakopto paper discusses for the first time, a new effect – a false electrical mismatch in post-layout simulations for perfectly symmetric nets. This effect is caused by the difference in distributions of parasitic coupling capacitors over the nodes of parasitic resistor networks, even for symmetric nets. This, in turn,… Read More
