Can a hierarchical Test flow be used on a flat design?

Can a hierarchical Test flow be used on a flat design?
by Tom Simon on 08-15-2019 at 10:00 am

It is pretty common for physical layout to work from a flattened hierarchy for blocks or even full chips, even though the front-end design starts with a hierarchical representation. This was not always the case. Way back when, the physical layout matched the logical hierarchy during the design process. Of course, this led to all… Read More


Automotive Market Pushing Test Tool Capabilities

Automotive Market Pushing Test Tool Capabilities
by Tom Simon on 07-09-2019 at 8:00 am

It’s easy to imagine that the main impetus for automotive electronics safety standards like ISO 26262 is the emergence of autonomous driving technology. However, even cars that do not offer this capability rely heavily on electronics for many critical systems. These include engine control, braking, crash sensors, and stability… Read More


Mentor’s Busy ITC and Major Test Product Updates

Mentor’s Busy ITC and Major Test Product Updates
by Tom Simon on 10-31-2018 at 1:00 pm

In conjunction with the 2018 International Test Conference, Mentor has several interesting test announcements. They also have a busy round of technical activities, including a number of technical papers, presentations, tutorials and a poster from a major customer about using Mentor. I’d like to touch on the two product related… Read More


Price of Admission $0.00 at Inaugural Silicon Valley Conference

Price of Admission $0.00 at Inaugural Silicon Valley Conference
by Beth Martin on 10-20-2015 at 7:00 am

Image RemovedBack in 2002, the Southwest DFT Conference was born and experts on design for test (DFT) and test got together to share ideas and talk to people in this industry that were trying to solve test challenges of the day.… Read More


Don’t Miss Mentor Graphics U2U San Jose, April 21, 2015

Don’t Miss Mentor Graphics U2U San Jose, April 21, 2015
by Beth Martin on 04-16-2015 at 10:00 pm

Image RemovedMentor Graphics’ User2User conference will be held next week on April 21[SUP]st[/SUP] at the San Jose DoubleTree Hotel. This one-day, free conference is the perfect opportunity to learn, network, and share with other Mentor Graphics users.

The day starts off with back-to-back keynotes that examine different … Read More


Mentor and ASSET Intertech Do a DFT World Tour

Mentor and ASSET Intertech Do a DFT World Tour
by Beth Martin on 02-19-2015 at 1:01 pm

The Mentor Graphics test folks and ASSET Intertech have teamed up to provide a series of free DFT seminars in the US, Europe, and Asia. The first one is in Austin, TX on February 19, 2015, and the last is in Tokyo on April 24. Hereis the full list of locations and dates.

Image RemovedThe morning session covers IJTAG. The new IEEE 1687 Internal… Read More


Its a bouncing baby IEEE standard!

Its a bouncing baby IEEE standard!
by Beth Martin on 11-04-2014 at 12:00 am

Pass the cigars! On November 3rd, 2014, the IEEE-SA Standards Board finally approved IEEE P1687 as a new standard. From now on, you can drop the “P” and just call it 1687, or to its friends, IJTAG. Now would be a good time to sign up for an IJTAG technical workshop.

The new IEEE 1687 Internal JTAG (IJTAG) standard is changing… Read More


Smart Strategies for Efficient Testing of 3D-ICs

Smart Strategies for Efficient Testing of 3D-ICs
by Pawan Fangaria on 02-12-2014 at 6:30 am

3D-IC has a stack of dies connected and packaged together, and therefore needs new testing strategies other than testing a single die. It’s given that a single defective die can render the whole of 3D-IC unusable, so each die in the stack must be completely and perfectly tested before its entry into that stack. Looking at it from a … Read More


What Mentor Said at ITC

What Mentor Said at ITC
by Beth Martin on 09-26-2013 at 4:47 pm

At the ITC test conference in early September, Mentor made three announcements. ITC is a big event for Mentor’s test group, and where they usually roll out their new tools and capabilities. The indefatigable Steve Pateras was captured on film describing them.

I’ve summarize Mentor’s three announcements and added… Read More


Why Adopt Hierarchical Test for SoC Designs

Why Adopt Hierarchical Test for SoC Designs
by Daniel Payne on 08-15-2013 at 4:37 pm

IC designers have been creating with hierarchy for years to better manage large design sizes, however for the test world the concept of hierarchy and emerging standards is a bit newer. TSMC and Synopsys jointly created a webinarthat addresses hierarchical test, so I’ve attended it this week and summarized my findings here.… Read More