Getting to the 32nm/28nm Common Platform node with Mentor IC Tools

Getting to the 32nm/28nm Common Platform node with Mentor IC Tools
by Daniel Payne on 01-17-2011 at 6:04 pm

Last week I talked with two experts at Mentor about the challenges of getting IC designs into the 32nm/28nm node on the Common Platform (IBM, GLOBALFOUNDRIES and Samsung). Global Foundries issued a press release talking about how the four major EDA companies have worked together to qualify EDA tools for this node.

Sudhakar Jilla,… Read More


Critical Area Analysis and Memory Redundancy

Critical Area Analysis and Memory Redundancy
by SStalnaker on 10-08-2010 at 8:08 pm

Simon Favre, one of our Calibre Technical Marketing Engineers, presented a paper on Critical Area Analysis and Memory Redundancy at the 2010 IEEE North Atlantic Test Workshop in Hopewell Junction, NY, just up the road from Fishkill. As Simon says…

Fishkill, New York. IBM is in Fishkill. IBM invented Critical Area Analysis in what,… Read More