When it comes to High-Sigma verification, go for insight, accuracy and performance

When it comes to High-Sigma verification, go for insight, accuracy and performance
by Michael Pronath on 07-04-2015 at 7:00 am

There are three critical goals that designers of custom digital designs and memories look to achieve with high sigma verification:

(1) obtaining accurate results,
(2) achieving results with good run-time (efficiency), and
(3) gaining proper insight into how their circuit is behaving along with an understanding of failure … Read More


Semiconductor Yield @ 28nm HKMG!

Semiconductor Yield @ 28nm HKMG!
by Daniel Nenni on 08-28-2011 at 4:00 pm

Whether you use a gate-first or gate-last High-k Metal Gate implementation, yield will be your #1 concern at 28nm, which makes variation analysis and verification a big challenge. One of the consulting projects I have been working on with the foundries and top fabless semiconductor companies is High-Sigma Monte Carlo (HSMC) … Read More