Self-heating and trapping enhancements in GaN HEMT models

Self-heating and trapping enhancements in GaN HEMT models
by Don Dingee on 05-02-2024 at 10:00 am

RTH0 extraction

High-fidelity models incorporating real-world, cross-domain effects are essential for accurate RF system simulation. The surging popularity of gallium nitride (GaN) technology in 5G base stations, satellite communication, defense systems, and other applications raises the bar for transistor modeling. Keysight dives… Read More