New ERC Tools Catch Design Errors

New ERC Tools Catch Design Errors
by glforte on 02-11-2011 at 2:18 pm

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A growing number of reports highlight a class of design errors that is difficult to check using more traditional methods, and can potentially affect a wide range of IC designs, especially where high reliability is a must.By Matthew Hogan

Today’s IC designs are complex. They contain vast arrays of features and functionality in Read More


Computational Lithography, Scaling’s Best Friend

Computational Lithography, Scaling’s Best Friend
by glforte on 11-03-2010 at 11:51 pm

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By Joseph Sawicki, Vice President & General Manager, Design to Silicon Division

It is one of the more amazing stories in the continued march of Moore’s Law over the past four nodes. Previously scaling was enabled solely though changes in the physical domain, whether through decreasing the wavelength of light, increasing … Read More