A Robust Lint Methodology Ensures Faster Design Closure

A Robust Lint Methodology Ensures Faster Design Closure
by Pawan Fangaria on 06-03-2015 at 4:00 am

With the increase in SoC designs’ sizes and complexities, the verification continuum has grown larger to an extent that the strategies for design convergence need to be applied from the very beginning of the design flow. Often designers are stuck with never ending iterations between RTL, gate and transistor levels at different… Read More


Improve Test Robustness & Coverage Early in Design

Improve Test Robustness & Coverage Early in Design
by Pawan Fangaria on 11-03-2014 at 5:00 pm

In a semiconductor design, keeping the design testable with high test coverage has always been a requirement. However with shrinking technology nodes and large, dense SoC designs and complex logic structures, while it has become mandatory to reach close to 100% test coverage, it’s extremely difficult to cope with the explosion… Read More


A Complete Scalable Solution for IP Signoff

A Complete Scalable Solution for IP Signoff
by Pawan Fangaria on 10-20-2014 at 7:00 am

In an SoC world driven by IP, where an SoC can have hundreds of IP (sourced not only from 3[SUP]rd[/SUP] party but also from internal business units which can have a lot of legacy) integrated together, it has become essential to have a comprehensive and standard method to verify and signoff the IP. Additionally, these checks must … Read More