Webinar: Efficient Way to UVM Constraint Randomization Debug

Online

This webinar equips you with effective strategies to tackle randomization-related errors within your UVM verification environment. We'll explore the power of Cadence's Verisium Debug, a tool designed to simplify the debugging process. What You Will Learn Practical techniques for isolating and resolving randomization-related errors Optimize your UVM verification environment for robust functionality Gain valuable insights …

Webinar: Enhancing Manufacturing Test Flows with Synopsys VC Z01X

Online

Leveraging functional patterns is crucial for achieving high defect coverage and reducing defective parts per million (DPPM) levels. Synopsys VC Z01X fault simulator offers enhanced fault coverage in manufacturing test flows, complementing ATPG tools like Synopsys TestMAX ATPG. In this presentation we will delve into unique coverage scenarios, such as resets and clocks blocked during ATPG mode. We'll …

Webinar: Fab.da: Comprehensive AI-Driven Process Analytics for Faster Ramp and Efficient High-Volume Manufacturing

Online

The challenges before semiconductor fabs are expansive and evolving. As the size of chips shrinks from nanometers to eventually angstroms, the complexity of the manufacturing process increases in response. To …