RVN! 26 Banner revised (800 x 100 px) (600 x 100 px)
WP_Term Object
(
    [term_id] => 23705
    [name] => 3D IC
    [slug] => 3dic
    [term_group] => 0
    [term_taxonomy_id] => 23705
    [taxonomy] => category
    [description] => 
    [parent] => 0
    [count] => 120
    [filter] => raw
    [cat_ID] => 23705
    [category_count] => 120
    [category_description] => 
    [cat_name] => 3D IC
    [category_nicename] => 3dic
    [category_parent] => 0
    [is_post] => 
)

Synopsys Advances Hardware Assisted Verification for the AI Era

Synopsys Advances Hardware Assisted Verification for the AI Era
by Kalar Rajendiran on 03-26-2026 at 6:00 am

Software Defined HAV, Scalability, Density, Performance and EP Ready Hardware

At the 2026 Synopsys Converge Event, Synopsys announced a broad set of new products and platform upgrades, with its hardware-assisted verification (HAV) announcement emerging as a key highlight within that lineup. A key aspect of this announcement was moving beyond a hardware centric model to a more scalable, programmable … Read More


Scaling Multi-Die Connectivity: Automated Routing for High-Speed Interfaces

Scaling Multi-Die Connectivity: Automated Routing for High-Speed Interfaces
by Kalar Rajendiran on 03-23-2026 at 10:00 am

Bump maps for HBM PHY and HBM memory

This article concludes the three-part series examining key methodologies required for successful multi-die design. The first article Reducing Risk Early: Multi-Die Design Feasibility Exploration focused on feasibility exploration and early architectural validation, while the second article Building the InterconnectRead More


Arteris Highlights a Path to Scalable Multi-Die Systems at the Chiplet Summit

Arteris Highlights a Path to Scalable Multi-Die Systems at the Chiplet Summit
by Mike Gianfagna on 03-23-2026 at 6:00 am

Arteris Highlights a Path to Scalable Multi Die Systems at the Chiplet Summit

At the recent Chiplet Summit, presentations, discussions and general participation could be broken down into a few broad categories. There were presentations of actual chiplet designs, either as building blocks or end products. There were presentations regarding design tools and methodologies to support and accelerate … Read More


Siemens Wins Best in Show Award at Chiplet Summit and Targets Broad 3D IC Design Enablement

Siemens Wins Best in Show Award at Chiplet Summit and Targets Broad 3D IC Design Enablement
by Mike Gianfagna on 03-19-2026 at 8:00 am

Siemens Wins Best in Show Award at Chiplet Summit and Targets Broad 3D IC Enablement

The recent Chiplet Summit in Santa Clara was buzzing with new designs and new design methods. It felt like the industry had turned a corner at this year’s event with lots of new technology and design success on display. Siemens EDA had a large presence at the show and took home the Best in Show Award for Packaging Design. There were a … Read More


Qnity and Silicon Catalyst Light a Path to Success at the Chiplet Summit

Qnity and Silicon Catalyst Light a Path to Success at the Chiplet Summit
by Mike Gianfagna on 03-11-2026 at 10:00 am

Qnity and Silicon Catalyst Light a Path to Success at the Chiplet Summit

The Chiplet Summit recently concluded. Multi-die heterogeneous design is a hot topic these days and chiplets are a key enabler for this trend. The conference was noticeably larger this year. There were many presentations and exhibits that focused on areas such as how to design chiplets, what standards are important, how to integrate… Read More


Efficient Bump and TSV Planning for Multi-Die Chip Designs

Efficient Bump and TSV Planning for Multi-Die Chip Designs
by Daniel Nenni on 03-10-2026 at 6:00 am

Efficient Bump and TSV Planning for Multi Die Chip Designs

The semiconductor industry has experienced rapid advancements in recent years, particularly with the increasing demand for high-performance computing, artificial intelligence, and advanced automotive systems. Traditional single-die chip designs are often unable to meet modern PPA requirements. As a result, engineers… Read More


Reducing Risk Early: Multi-Die Design Feasibility Exploration

Reducing Risk Early: Multi-Die Design Feasibility Exploration
by Kalar Rajendiran on 03-05-2026 at 10:00 am

Feasibility Thermal Map

The semiconductor industry is entering a new era in system design. As traditional monolithic scaling approaches its economic and physical limits, multi-die architectures are emerging as a primary pathway for delivering continued improvements in performance, power efficiency, and integration density. By distributing … Read More


Building the Interconnect Foundation: Bump and TSV Planning for Multi-Die Systems

Building the Interconnect Foundation: Bump and TSV Planning for Multi-Die Systems
by Kalar Rajendiran on 03-03-2026 at 10:00 am

UCIe bump planning in 3DIC Compiler Platform

The first article in this series examined how feasibility exploration enables architects to evaluate multi-die system configurations while minimizing early design risk. Once architectural decisions are validated, designers must translate conceptual connectivity requirements into physical interconnect infrastructure.… Read More


Accelerating Static ESD Simulation for Full-Chip and Multi-Die Designs with Synopsys PathFinder-SC

Accelerating Static ESD Simulation for Full-Chip and Multi-Die Designs with Synopsys PathFinder-SC
by Kalar Rajendiran on 02-17-2026 at 10:00 am

SNPS PathFinder SC ESD Verification

As analog and mixed-signal designs become increasingly complex, parasitic effects dominate both design time and cost, consuming 30–50% of engineers’ effort in debugging and reanalyzing circuits. Addressing these multiphysics effects requires early verification strategies and reliable simulation solutions. Modern … Read More