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Podcast EP338: How Thermo Fisher Scientific Helps Advanced Semiconductor Development with Dr. Mohan Iyer

Podcast EP338: How Thermo Fisher Scientific Helps Advanced Semiconductor Development with Dr. Mohan Iyer
by Daniel Nenni on 04-03-2026 at 10:00 am

Daniel is joined by Dr. Mohan Iyer, who serves as the vice president and general manager of the Semiconductor Business Unit at Thermo Fisher Scientific, a global leader in providing reference metrology, defect characterization, and localization equipment. These advanced systems are essential for driving innovation, accelerating… Read More


Alchip’s Leadership in ASIC Innovation: Advancing Toward 2nm Semiconductor Technology

Alchip’s Leadership in ASIC Innovation: Advancing Toward 2nm Semiconductor Technology
by Daniel Nenni on 04-01-2026 at 10:00 am

Alchip’s Leadership in ASIC Innovation

Alchip Technologies has recently reported significant progress in the development of advanced 2nm  ASICs, positioning itself as a leader in next-generation semiconductor design for AI and HPC. The announcement highlights Alchip’s efforts to commercialize cutting-edge chip technologies and deliver highly customized … Read More


Synopsys Advances Hardware Assisted Verification for the AI Era

Synopsys Advances Hardware Assisted Verification for the AI Era
by Kalar Rajendiran on 03-26-2026 at 6:00 am

Software Defined HAV, Scalability, Density, Performance and EP Ready Hardware

At the 2026 Synopsys Converge Event, Synopsys announced a broad set of new products and platform upgrades, with its hardware-assisted verification (HAV) announcement emerging as a key highlight within that lineup. A key aspect of this announcement was moving beyond a hardware centric model to a more scalable, programmable … Read More


Scaling Multi-Die Connectivity: Automated Routing for High-Speed Interfaces

Scaling Multi-Die Connectivity: Automated Routing for High-Speed Interfaces
by Kalar Rajendiran on 03-23-2026 at 10:00 am

Bump maps for HBM PHY and HBM memory

This article concludes the three-part series examining key methodologies required for successful multi-die design. The first article Reducing Risk Early: Multi-Die Design Feasibility Exploration focused on feasibility exploration and early architectural validation, while the second article Building the InterconnectRead More


Arteris Highlights a Path to Scalable Multi-Die Systems at the Chiplet Summit

Arteris Highlights a Path to Scalable Multi-Die Systems at the Chiplet Summit
by Mike Gianfagna on 03-23-2026 at 6:00 am

Arteris Highlights a Path to Scalable Multi Die Systems at the Chiplet Summit

At the recent Chiplet Summit, presentations, discussions and general participation could be broken down into a few broad categories. There were presentations of actual chiplet designs, either as building blocks or end products. There were presentations regarding design tools and methodologies to support and accelerate … Read More


Siemens Wins Best in Show Award at Chiplet Summit and Targets Broad 3D IC Design Enablement

Siemens Wins Best in Show Award at Chiplet Summit and Targets Broad 3D IC Design Enablement
by Mike Gianfagna on 03-19-2026 at 8:00 am

Siemens Wins Best in Show Award at Chiplet Summit and Targets Broad 3D IC Enablement

The recent Chiplet Summit in Santa Clara was buzzing with new designs and new design methods. It felt like the industry had turned a corner at this year’s event with lots of new technology and design success on display. Siemens EDA had a large presence at the show and took home the Best in Show Award for Packaging Design. There were a … Read More


Qnity and Silicon Catalyst Light a Path to Success at the Chiplet Summit

Qnity and Silicon Catalyst Light a Path to Success at the Chiplet Summit
by Mike Gianfagna on 03-11-2026 at 10:00 am

Qnity and Silicon Catalyst Light a Path to Success at the Chiplet Summit

The Chiplet Summit recently concluded. Multi-die heterogeneous design is a hot topic these days and chiplets are a key enabler for this trend. The conference was noticeably larger this year. There were many presentations and exhibits that focused on areas such as how to design chiplets, what standards are important, how to integrate… Read More


Efficient Bump and TSV Planning for Multi-Die Chip Designs

Efficient Bump and TSV Planning for Multi-Die Chip Designs
by Daniel Nenni on 03-10-2026 at 6:00 am

Efficient Bump and TSV Planning for Multi Die Chip Designs

The semiconductor industry has experienced rapid advancements in recent years, particularly with the increasing demand for high-performance computing, artificial intelligence, and advanced automotive systems. Traditional single-die chip designs are often unable to meet modern PPA requirements. As a result, engineers… Read More


Reducing Risk Early: Multi-Die Design Feasibility Exploration

Reducing Risk Early: Multi-Die Design Feasibility Exploration
by Kalar Rajendiran on 03-05-2026 at 10:00 am

Feasibility Thermal Map

The semiconductor industry is entering a new era in system design. As traditional monolithic scaling approaches its economic and physical limits, multi-die architectures are emerging as a primary pathway for delivering continued improvements in performance, power efficiency, and integration density. By distributing … Read More