This article concludes the three-part series examining key methodologies required for successful multi-die design. The first article Reducing Risk Early: Multi-Die Design Feasibility Exploration focused on feasibility exploration and early architectural validation, while the second article Building the Interconnect… Read More
Tag: UCIe
Podcast EP335: The Far Reaching Impact of UCIe with Dr. Debendra Das Sharma
Daniel is joined by Dr. Debendra Das Sharma, a Senior Fellow and Chief I/O architect in the Data Platforms and Artificial Intelligence Group at Intel. He is a member of the National Academy of Engineering (NAE), Fellow of IEEE, and Fellow of International Academy of AI Sciences. He is a leading expert on I/O subsystem and interface… Read More
Keynote: On-Package Chiplet Innovations with UCIe
In the rapidly evolving landscape of semiconductor technology, the Universal Chiplet Interconnect Express (UCIe) emerges as a groundbreaking open standard designed to revolutionize on-package chiplet integrations. Presented by Dr. Debendra Das Sharma, Chair of the UCIe Consortium and Intel Senior Fellow, at the Chiplet… Read More
TSMC and Cadence Strengthen Partnership to Enable Next-Generation AI and HPC Silicon
TSMC continues to reinforce its leadership in advanced semiconductor manufacturing through its deepening collaboration with Cadence Design Systems. The expanded partnership focuses on enabling next-generation artificial intelligence and high-performance computing innovations by aligning advanced electronic design… Read More
Podcast EP329: How Marvell is Addressing the Power Problem for Advanced Data Centers with Mark Kuemerle
Daniel is joined by Mark Kuemerle, Vice President of Technology, Custom Cloud Solutions at Marvell. Mark is responsible for defining leading-edge ASIC offerings and architects system-level solutions. Before joining Marvell, Mark was a Fellow in Integrated Systems Architecture at GLOBALFOUNDRIES and has held multiple engineering… Read More
Webinar: Synopsys and TSMC Discuss Multi-Die Monitoring, Embedded Test & Repair Flows
Date: Feb 04, 2026 | 9:00 AM PST
Featured Speakers:
- Dr. Yervant Zorian , Chief Architect and Fellow at Synopsys, President of Synopsys Armenia
- Dr. Sandeep K Goel, Senior Director, TSMC
Our upcoming Synopsys webinar features an exciting real-world case study showcasing Synopsys IP and EDA tools with UCIe-based chiplets on advanced
Revitalizing Semiconductor StartUps
Tarun Verma, Managing Partner of Silicon Catalyst, delivered a keynote at Verification Futures Austin titled “Revitalizing Semiconductor StartUps.” Drawing from his role in the world’s only accelerator focused on the global semiconductor industry, Tarun outlined the sector’s resurgence, persistent… Read More
Chiplets: Powering the Next Generation of AI Systems
AI’s rapid expansion is reshaping semiconductor design. The compute and I/O needs of modern AI workloads have outgrown what traditional SoC scaling can deliver. As monolithic dies approach reticle limits, yields drop and costs rise, while analog and I/O circuits gain little from moving to advanced process nodes. To sustain … Read More
Advancing Semiconductor Design: Intel’s Foveros 2.5D Packaging Technology
In the rapidly evolving landscape of semiconductor manufacturing, the demand for processors that handle increasing workloads while maintaining power efficiency and compact form factors has never been higher. Intel’s Foveros 2.5D packaging technology emerges as a pivotal innovation, enabling denser die integration… Read More
Smart Verification for Complex UCIe Multi-Die Architectures
By Ujjwal Negi – Siemens EDA
Multi-die architectures are redefining the limits of chip performance and scalability through the integration of multiple dies into a single package to deliver unprecedented computing power, flexibility, and efficiency. At the heart of this transformation is the Universal Chiplet Interconnect… Read More
