FinFET Reliability Analysis with Device Self-Heating

FinFET Reliability Analysis with Device Self-Heating
by Tom Dillinger on 10-22-2015 at 12:00 pm

At the recent TSMC OIP symposium, a collaborative presentation by Synopsys and Xilinx highlighted the importance of incorporating the local FinFET device self-heating temperature increase on the acceleration of device reliability mechanisms.… Read More


Meeting DFM Challenges with Hierarchical Fill Data Insertion

Meeting DFM Challenges with Hierarchical Fill Data Insertion
by Tom Dillinger on 10-11-2015 at 12:00 pm

To describe the latest methodology for the addition of Design for Manufacturability fill shapes to design layout data, it’s appropriate to borrow a song title from Bob Dylan – The Times They Are A Changin’. The new technical requirements are best summarized as: “The goal is now to add as much fill as possible, which (ideally) looksRead More


Top 10 Reasons to invest in Interactive Design Rule Checking tools

Top 10 Reasons to invest in Interactive Design Rule Checking tools
by Tom Dillinger on 10-01-2015 at 12:00 pm

One of the most energetic presentations at the recent TSMC OIP 2015 symposium was given by Tom Williams from Qualcomm, who shared his insights (and enthusiasm!) for Mentor’s Calibre RealTime interactive Design Rule Checking (iDRC) product.

Paraphrasing Tom’s presentation (and with a tip of the hat to David Letterman), here … Read More