Yield, no topic is more important to the semiconductor ecosystem. After spending a significant part of my career on Design for Manufacturability (DFM) and Design for Yield (DFY), I’m seriously offended when semiconductor professionals make false and misleading statements that negatively affects the industry that … Read More
The TSMC OIP conference was Monday and Tuesday of last week. You have probably NOT read about it since it was invitation only and press was not invited. Slides were not made available (except for Mentor), no photos or video were allowed, it was a very private affair. Given that, I won’t be able to go into great detail but I will give you… Read More
Whether you use a gate-first or gate-last High-k Metal Gate implementation, yield will be your #1 concern at 28nm, which makes variation analysis and verification a big challenge. One of the consulting projects I have been working on with the foundries and top fabless semiconductor companies is High-Sigma Monte Carlo (HSMC) … Read More
My visit to Taiwan last week was very encouraging. No earthquake, no typhoon, and both TSMC and UMC again posted record financial results, giving a peek into what 2011 has in store for us semiconductor professionals around the world.
A transcript from the TSMC earnings call can be foundhere, the UMC transcript is here. The TSMC transcript… Read More
Transistors may be shrinking but atoms are not. Transistors are now just a handful of atoms so it matters even more when a couple of those atoms are out of place. Process variations, whether they are statistical, proximity, or otherwise, have got to be thoughtfully accounted for if we are to achieve the low-power, high-performance,… Read More
