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I wrote recently on ANSYS and TSMC’s joint work on thermal reliability workflows, as these become much more important in advanced processes and packaging. Xilinx provided their own perspective on thermal reliability analysis for their unquestionably large systems – SoC, memory, SERDES and high-speed I/O – stacked within a … Read More
When I designed DRAM chips at Intel back in the 1970’s we didn’t really know what the die temperature would be before taping out silicon, instead we waited for packaged parts to come back and then did our thermal measurements. IC designers today don’t have that luxury of taping out their new SoC without having … Read More
