Design sizes and complexities have grown exponentially (it’s a Law!), and consequentially the task of silicon test has become proportionally more expensive. The cost of testing a device is proportional to the amount of test data that is applied, and therefore the time it takes, which in turn is proportional to both design size … Read More
The Mentor Graphics test folks and ASSET Intertech have teamed up to provide a series of free DFT seminars in the US, Europe, and Asia. The first one is in Austin, TX on February 19, 2015, and the last is in Tokyo on April 24. Hereis the full list of locations and dates.
The morning session covers IJTAG. The new IEEE 1687 Internal JTAG (IJTAG)… Read More
Early in my so-called EE career, I sat in a workshop led by the director of quality for the Ford truck plant in Louisville, KY, where “Quality is Job #1.” At that time, they were gaining experience in electronic control modules (ECMs) for fuel efficiency and emissions control. Who better to transfer the secrets of Crosby and Deming… Read More
Engineers have this fascination with how things work. They are thrilled to tear stuff apart, and sometimes to even be able to put it back together afterwords. So I can keep my recovering engineer card, I thought I’d take a few moments and look inside a technology Daniel Payne and I have been covering here, exploring where the idea started… Read More
