Mentor DefectSim Seen as Breakthrough for AMS Test

Mentor DefectSim Seen as Breakthrough for AMS Test
by Mitch Heins on 11-21-2016 at 4:00 pm

For decades, digital test has been fully automated including methodologies and automation for test pattern generation, grading and test time compression. Automation for analog and mixed-signal (AMS) IC test has not however kept pace. This is troubling as according to IBSapproximately 85% of SoC design starts are now AMS designs.… Read More


If requirements ask for it, it had better be there

If requirements ask for it, it had better be there
by Don Dingee on 01-29-2014 at 8:00 pm

Engineers are known for their attention to detail and precision in thinking, but sometimes still struggle during compliance audits. This is especially true the longer a list of requirements becomes, especially unstructured lists kept in spreadsheets and on Post-It notes.

It gets even more complicated, because in defense circles… Read More