DesignCon 2016 — signal integrity must be power-aware!

DesignCon 2016 — signal integrity must be power-aware!
by Tom Dillinger on 01-31-2016 at 6:00 pm

DesignCon is a unique conference — its tagline is “Where the Chip meets the Board”. Held each January in Santa Clara, the conference showcases a wealth of new technologies for advanced packaging, printed circuit board fabrication, connectors, cables, and related analysis equipment (e.g, BERT, VNA, scopes). Of specific… Read More


Solution for PI, TI & SI Issues in 3D-ICs

Solution for PI, TI & SI Issues in 3D-ICs
by Pawan Fangaria on 11-30-2014 at 7:00 pm

As we move towards packing more and more functionalities and increasing densities of SoCs, the power, thermal and signal integrity issues keep on rising. 3D-IC is a great concept to stack multiple dies on top of each other vertically. While it brings lot of avenues to package dies with multiple functions together, it has challenges… Read More


Power and Reliability Sign-off – A must, but how?

Power and Reliability Sign-off – A must, but how?
by Pawan Fangaria on 07-29-2013 at 11:00 am

At the onset of SoCs with multiple functionalities being packed together at the helm of technologies to improve upon performance and area; power, which was earlier neglected, has become critical and needs special attention in designing SoCs. And there comes reliability considerations as well due to multiple electrical and … Read More


Apache on Signal Integrity

Apache on Signal Integrity
by Paul McLellan on 11-20-2012 at 1:09 pm

Matt Elmore has a two-part blog about the growing complexity of signal integrity analysis, both on the chip itself and the increasingly complex analysis required to make sure that signals (and power) get in and out of the chip from the board cleanly, especially to memory, which requires simultaneous analysis of chip-package-system… Read More