Solido Saves Silicon with Six Sigma Simulation

Solido Saves Silicon with Six Sigma Simulation
by Tom Simon on 08-16-2016 at 4:00 pm

When pushing the boundaries of power and performance in leading edge memory designs, yield is always an issue. The only way to ensure that memory chips will yield is through aggressive simulation, especially at process corners to predict the effects of variation. In a recent video posted on the Solido website, John Barth of Invecas… Read More


Replacing the British Museum Algorithm

Replacing the British Museum Algorithm
by Paul McLellan on 09-14-2015 at 7:00 am

Image RemovedIn principle, one way to address variation is to do simulations at lots of PVT corners. In practice, most of this simulation is wasted since it adds no new information, and even so, important corners will get missed. This is what Sifuei Ku of Microsemi calls the British Museum Algorithm. You walk everywhere. And if you… Read More