You are currently viewing SemiWiki as a guest which gives you limited access to the site. To view blog comments and experience other SemiWiki features you must be a registered member. Registration is fast, simple, and absolutely free so please,
join our community today!
The cost of an IC depends on many factors like: NRE, masks, fabrication, testing, packaging. Product engineers are tasked with testing each part and understanding what exactly is limiting the yields. Every company has a methodology for Physical Failure Analysis (PFA), and the challenge is to make this process as quick as possible,… Read More
A Goldmine of Tester Databy Beth Martin on 07-10-2013 at 2:06 pmCategories: EDA
Yesterday at SEMICON West I attended an interesting talk about how to use the masses of die test data to improve silicon yield. The speaker was Dr. Martin Keim, from Mentor Graphics.
First of all, he pointed out that with advanced process nodes (45nm, 32nm, and 28nm), and new technologies like FinFETs, we get design-sensitive defects.… Read More
