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Semiconductor chips are all tested prior to shipment in order to weed out early failures, however there are some more subtle reliability effects that only appear in the longer term, like clock aging. There’s even a classic chart that shows the “bathtub curve” of failure rates over time:
If reality and expectations… Read More
At the recent TSMC OIP symposium, a collaborative presentation by Synopsys and Xilinx highlighted the importance of incorporating the local FinFET device self-heating temperature increase on the acceleration of device reliability mechanisms.… Read More
