Seeing 1/f noise more accurately

Seeing 1/f noise more accurately
by Don Dingee on 06-15-2022 at 10:00 am

Decimation chain speeds up measurements for 1/f noise

Electronics noise is often described as “white,” spread evenly across a band, typical on older semiconductor processes where thermal and shot noise dominate. As transistors shrink, “pink” 1/f noise takes over at low frequencies – becoming stronger in advanced processes and quantum computing technology. But it’s not an easy… Read More


Combining Parametric Modeling with Design Exploration

Combining Parametric Modeling with Design Exploration
by Admin on 06-18-2020 at 10:00 am

June 18, 2020

10 AM (EDT) / 2 PM (GMT)

Venue:
Online

Computer-aided engineering (CAE) helps investigate large numbers of product variants across numerous product application scenarios. This is a key strategy to cut costs and shorten design cycles during the virtual product development process. Ansys has a long history in supporting

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