Electronics noise is often described as “white,” spread evenly across a band, typical on older semiconductor processes where thermal and shot noise dominate. As transistors shrink, “pink” 1/f noise takes over at low frequencies – becoming stronger in advanced processes and quantum computing technology. But it’s not an easy… Read More
Tag: parametric modeling
Combining Parametric Modeling with Design Exploration
June 18, 2020
10 AM (EDT) / 2 PM (GMT)
Venue:
Online
Computer-aided engineering (CAE) helps investigate large numbers of product variants across numerous product application scenarios. This is a key strategy to cut costs and shorten design cycles during the virtual product development process. Ansys has a long history in supporting