Noise-Coupled Analysis for Automotive ICs at DAC

Noise-Coupled Analysis for Automotive ICs at DAC
by Daniel Payne on 06-20-2014 at 2:00 pm

My favorite method to learn about EDA tools at DACis by listening to actual IC designers, so on June 3rd I heard Jacob Bakker from NXP talk about his experience with noise coupled analysis for advanced mixed-signal automotive ICs.… Read More