There are two ways to see how resistant your designs are to single-event errors (SEE). One is to take the chip or even the entire system and put it in a neutron beam and measure how many problems occur in this extreme environment. While that may be a necessary part of qualification in some very high reliability situations, it is also … Read More
How reliable is your cell-phone? Actually, you don’t really care. It will crash from time to time due to software bugs and you’ll throw it away after two or three years. If a few phones also crash due to stray neutrons from outer space or stray alpha particles from the solder balls used in the flip-chip bonding then nobody… Read More
So you want to know how reliable your chips are and how susceptible they are to single event effects (SEEs) where a neutron or an alpha particle causes a storage element (flop or memory cell) to flip in a way that alters the behavior of the device. There are two ways a particle hitting a device might not cause a problem. Firstly, the particle… Read More
