IMEC’s Advanced Node Yield Model Now Addresses EUV Stochastics

IMEC’s Advanced Node Yield Model Now Addresses EUV Stochastics
by Fred Chen on 08-23-2025 at 8:00 am

EUV Stochastics

It lays the foundation for the Stochastics Resolution Gap

Chris Mack, the CTO of Fractilia, recently wrote of the “Stochastics Resolution Gap,” which is effectively limiting the manufacturability of EUV despite its ability to reach resolution limits approaching 10 nm in the lab [1,2]. As researchers have inevitably found, … Read More