Synopsys Design IP for Modern SoCs and Multi-Die Systems

Synopsys Design IP for Modern SoCs and Multi-Die Systems
by Kalar Rajendiran on 04-11-2024 at 10:00 am

Synopsys IP Scale, a Sustainable Advantage

Semiconductor intellectual property (IP) plays a critical role in modern system-on-chip (SoC) designs. That’s not surprising given that modern SoCs are highly complex designs that leverage already proven building blocks such as processors, interfaces, foundational IP, on-chip bus fabrics, security IP, and others. This… Read More


Webinar: Accelerating Mainstream Adoption of Multi-Die Systems

Webinar: Accelerating Mainstream Adoption of Multi-Die Systems
by Admin on 08-21-2023 at 1:20 pm

About

Synopsys recently hosted a panel discussion with Ansys, Bosch, Intel, and Samsung to share their insights on the rapid adoption of multi-die systems. We invite you to the public broadcast of the panel where each company shares their view on the groundbreaking technology, what challenges lie ahead, and how companies can Read More


Chiplet Interconnect Challenges and Standards

Chiplet Interconnect Challenges and Standards
by Daniel Payne on 05-25-2023 at 10:00 am

Multi die IP min

For decades now I’ve watched the incredible growth of SoCs in terms of die size, transistor count, frequency and complexity. Instead of placing all of the system complexity into a single, monolithic chip, there are now compelling reasons to use a multi-chip approach, like when the maximum die size limit is reached, or it’s… Read More


Webinar: Requirements for Multi-Die System Success

Webinar: Requirements for Multi-Die System Success
by Admin on 05-12-2023 at 7:06 pm

The industry is moving to multi-die systems to benefit from the greater compute performance, increased functionality, and new levels of flexibility. Challenges for multi-die systems are exacerbated and require greater focus on a number of requirements such as early partitioning and thermal planning, die/package co-design,… Read More


Webinar: Implementing DFT in 2.5/3D designs using Tessent Multi-die software

Webinar: Implementing DFT in 2.5/3D designs using Tessent Multi-die software
by Admin on 12-30-2022 at 11:47 am

Next-generation devices increasingly feature complex architectures that connect dies vertically (3D IC) or side-by-side (2.5D) so they behave as a single device. The new Tessent Multi-die software delivers comprehensive automation for the highly complex DFT tasks associated with these 2.5D and 3D IC designs.

Tessent Multi-die

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UCIe Specification Streamlines Multi-Die System Design with Chiplets

UCIe Specification Streamlines Multi-Die System Design with Chiplets
by Dave Bursky on 09-26-2022 at 10:00 am

protocol stack 1

Over the last few years, the design of application-specific ICs as well as high-performance CPUs and other complex ICs has hit a proverbial wall. This wall is built from several issues: first, chip sizes have grown so large that they can fill the entire mask reticle and that could limit future growth. Second, the large chip size impacts… Read More


Delivering Systemic Innovation to Power the Era of SysMoore

Delivering Systemic Innovation to Power the Era of SysMoore
by Kalar Rajendiran on 12-28-2021 at 6:00 am

Evolving Landscape

With the slowing down of Moore’s law , the industry as a whole has been working on various ways to maintain the rate of growth and advancements. A lot has been written up about various solutions being pursued to address specific aspects. The current era is being referred to by different names, SysMoore being one that Synopsys uses.… Read More