Synchronizer Optimization 101

Synchronizer Optimization 101
by Daniel Nenni on 02-22-2015 at 9:00 pm

A webinar presented Last week introduced two free aids to evaluating synchronizer Mean Time Between Failures (MTBF). The first, MetaACE LTD, is used to characterize the intrinsic parameters needed to calculate MTBF (tau and Tw). This limited version of MetaACE supports up to 250 circuit nodes, which is enough for a typical C-only-extracted… Read More


Ten Ways Your Synchronizer MTBF May Be Wrong

Ten Ways Your Synchronizer MTBF May Be Wrong
by Jerry Cox on 08-25-2013 at 10:30 pm

Estimating the MTBF of an SoC should always include an analysis of synchronizer reliability. Contemporary process nodes are introducing new challenges to the reliability of clock domain crossings so it is prudent to revisit how your simulation tool calculates a synchronizer’s MTBF. Let’s list the ten most common pitfalls.… Read More


Metastability Starts With Standard Cells

Metastability Starts With Standard Cells
by Daniel Nenni on 07-24-2013 at 8:05 pm

Metastability is a critical SoC failure mode that occurs at the interface between clocked and clockless systems. It’s a risk that must be carefully managed as the industry moves to increasingly dense designs at 28nm and below. Blendics is an emerging technology company that I have been working with recently, their MetaACERead More


Metastability and Fatal System Errors

Metastability and Fatal System Errors
by Daniel Nenni on 06-09-2013 at 3:00 pm

Metastability is an inescapable phenomenon in digital electronic systems. This phenomenon has been known to cause fatal system errors for half a century. Over the years, designers have used convenient rules of thumb for designing synchronizers to mitigate it. However, as digital circuits have become more complex, smaller … Read More