Reliability of ICs isn’t a new thing, because back in 1980 I was investigating why a DRAM chip using 6um technology was having yield loss due to electromigration effects. I recall looking through a microscope at a DRAM layout and slowly ramping up the Vdd level then suddenly the shiny aluminum interconnect started to change… Read More
Beyond DRC and LVS, why Reliability Verification is used by Foundries
