Machine Learning Accelerates Library Characterization by 50 Percent!

Machine Learning Accelerates Library Characterization by 50 Percent!
by Daniel Nenni on 04-06-2017 at 7:00 am

Standard cell, memory, and I/O library characterization is a necessary, but time-consuming, resource intensive, and error-prone process. With the added complexity of advanced and low power manufacturing processes, fast and accurate statistical and non-statistical characterization is challenging, creating the need … Read More


Variation Alphabet Soup

Variation Alphabet Soup
by Paul McLellan on 04-04-2015 at 1:00 pm

On-chip variation (OCV) is a major issue in timing signoff, especially at low voltages or in 20/16/14nm processes. For example, the graph below shows a 20nm inverter. At 0.6V the inverter has a delay of 2 (nominalized) units. But due to on-chip variation this might be as low as 1.5 units or as high as 3 units, which is a difference from… Read More