Free Webinar on Standard Cell Statistical Characterization

Free Webinar on Standard Cell Statistical Characterization
by Tom Simon on 02-20-2018 at 12:00 pm

Variation analysis continues to be increasingly important as process technology moves to more advanced nodes. It comes as no surprise that tool development in this area has been vigorous and aggressive. New higher reliability IC applications, larger memory sizes and much higher production volumes require sophisticated yield… Read More


We Need Libraries – Lots of Libraries

We Need Libraries – Lots of Libraries
by Tom Simon on 05-08-2017 at 12:00 pm

It was inevitable that machine learning (ML) would come to EDA. In fact, it has already been here a while in Solido’s variation tools. Now it has found an even more compelling application – library characterization. Just as ML has radically transformed other computational arenas; it looks like it will be extremely disruptive here… Read More


Solutions for Variation Analysis at 16nm and Beyond

Solutions for Variation Analysis at 16nm and Beyond
by Tom Simon on 09-22-2016 at 7:00 am

Variation is still the tough nut to crack for advanced process nodes. The familiar refrain of lower operating voltages and higher performance requirements make process variation an extremely important design consideration. As far back as the early 2000’s design teams have been looking for a better approach to model variation… Read More