New Frontiers in Scan Diagnosis

New Frontiers in Scan Diagnosis
by Paul McLellan on 01-03-2014 at 8:10 pm

As we move down into more and more advanced process nodes, the rules of how we test designs are having to change. One big challenge is the requirement to zoom in and fix problems by doing root cause analysis on test data alone, along with the rest of the design data such as detailed layout, optical proximity correction and so on. But without… Read More