Electrical Overstress (EOS) and Electrostatic Discharge (ESD) account for most of the field failures observed in the electronics industry. Although EOS and ESD damage can at times look quite similar to each other, the source each and the solution can be quite different. Therefore, it is important to be able to distinguish between… Read More
Do not lose sleep worrying that your integrated circuits might fail during EOS/ESD events. Join us for the 38th annual EOS/ESD Symposium in Anaheim, CA in September. Experts on the field will address the latest research on EOS and ESD in the rapidly changing world of electronics.
As electronics continue to become commonplace in… Read More
Last year, about 40% of new smartphones included Near Field Communication (NFC). Analysts predict that by 2017 there will be 1 billion NFC enabled phones. Clearly, the use of NFC is ramping up because it can simplify aspects as diverse as communication, secure payments, user authentication, and retail loyalty programs for instance.… Read More
