As hyperscaler chiplet and SoCs grow in complexity, integrating and validating multiple high-speed and low-speed interface protocols—such as PCIe, CXL, UCIe, AMBA, AXI, AHB, CHI, CSI2, and DSI2, can be a significant challenge. Design Verification Engineers and Technical Managers must ensure seamless protocol compliance
Accurate, precise, and fast RF / μW analysis made simple.
Be among the first to explore our newest and most extensive collection of compact signal generators and source analyzers. Experience live product demos and gain insights into the unique features of each product, including:
• Ultra-low phase noise
• Signal
An infrastructure to enable debug and trace for your RISC-V systems is essential to identifying root-causing bugs. In this presentation, we will give an overview of Tessent UltraSight-V, an end-to-end RISC-V debug and trace solution consisting of embedded IPs and software that integrate with industry-standard tools.
We will… Read More
This bootcamp guides you through the design of superconducting qubits and quantum amplifiers with product demonstrations to illustrate the concepts you can apply in your design flow today. By the end of this bootcamp, you will have a pathway toward realizing robust and scalable superconducting quantum chips, accelerating … Read More
The automotive industry stands on the cusp of a technological renaissance, ushering in an era where vehicles aren’t just tools of transportation, but interconnected nodes within a vast network of software-defined mobility. Central to this transformation is the concept of chiplets—miniaturized, modular components… Read More
The 30th IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, hot topics and new trends, as well as industrial case-studies and applications in the area of electronic-based circuits and systems testing, reliability, safety, security… Read More
Join us on January to dive deep into cutting-edge technical topics, from RF system design to high-speed digital standard-driven EM model extraction for PCBs.
This is your chance to:
Lee Harrison
Tessent Product Marketing Director
Siemens EDA
Continuous testing and monitoring of devices is required to guarantee optimal performance, reliability and safety throughout their operation. Tessent In-System Test
Join us at Realize LIVE Europe 2025 and experience the energetic general sessions, the engaging Solutions Center and the insightful workshops.
See firsthand the Siemens Software community event and witness again where your digital transformation gets real. Fast.
SURGE is an event for discussing new technologies, sharing user experiences, and discovering innovative techniques for advanced semiconductor design in the fields of TCAD, EDA, and IP. The event will be held online. We look forward to your participation.… Read More
