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Traditional logic testing relies on blasting pattern after pattern at the inputs, trying to exercise combinations to shake faults out of logic and hopefully have them manifested at an observable pin, be it a test point or a final output stage. It’s a remarkably inefficient process with a lot of randomness and luck involved.
Getting… Read More
SEMICON West is coming up this July 10-12 at the Moscone Center in San Francisco. It covers a broad swath of the microelectronics supply chain, but I was particularly interested in the test sessions. Here are two that I recommend.
“The Value of Test for Semiconductor Yield Learning” on Tuesday, July 10, at 1:30p. The… Read More
