DATE 2024by Admin on 09-25-2023 at 4:45 pm
Design, Automation and Test in Europe Conference | The European Event for Electronic System Design & Test
The DATE conference is the main European event bringing together designers and design automation users, researchers and vendors as well as specialists in the hardware and software design,… Read More
DATE 2023by Admin on 10-19-2022 at 2:29 pm
The DATE conference is the main European event bringing together designers and design automation users, researchers and vendors as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts a strong emphasis on both technology and systems, covering ICs/SoCs,… Read More
DATE 2022by Admin on 03-03-2022 at 1:42 pm
The DATE 2022 virtual conference platform is now accessible for all participants. From today on, participants can watch the pre-recorded presentation videos about the scientific papers from tracks D, A, T and E. During the live conference in March, authors will only briefly pitch their work and engage in Q&A sessions to … Read More
The DATE exhibition will run for three days (Tuesday-Thursday). The spacious exhibition area will be located close to the conference rooms in the heart of the Congress Center. As the area is positioned centrally and will host the coffee and lunch break area as well, a constant frequentation will be guaranteed.
DATE also arranges… Read More
At DATEthis year in Dresden, Bernhard Fischer from Siemens CT(Corporate Technology) has presented an interesting summary of the various techniques used for power modeling and analysis at the architectural level. He went through the pros and cons of using spreadsheets, timed virtual platforms annotated with power numbers … Read More
It has be come a cliche to say that “power is the new timing”, the thing that keeps designers up at night and drives the major architectural decisions in big SoCs. Nobody is saying it yet but perhaps “reliability is the new power” will be tomorrow’s received wisdom.
I talked to Adrian Evans of IROCTech… Read More
Now that the dominant approach to building an SoC is to get IP from a number of sources and assemble it into a chip, the issue of IP quality is more and more critical. A chip won’t work if the IP doesn’t work, but it is quite difficult to verify this because the SoC design team is not intimately familiar with the IP blocks since… Read More
My first chip design at Intel was a DRAM and we had a 5% yield problem caused by electromigration issues, yes, you can have EM issues even with 6um NMOS technology. We had lots of questions but precious few answers on how to pinpoint and eliminate the source of yield loss. Fortunately, with the next generation of DRAM quickly introduced… Read More
