Auto makers have historically been accused of things like planned obsolescence – redesigning parts to make repairs painfully or even prohibitively expensive – and the “warranty time-bomb”, where major systems seem to fail about a week after the warranty expires. Optimists would chalk both those up to relentless innovation,… Read More
You may have heard about cell-aware testing. It’s a transistor-level test (ATPG) methodology that is quickly becoming a hot topic. If you are involved in DFT and are looking for better quality and reliability, you should definitely know about cell-aware testing.
And lucky you, on May 16, 2013, you can attend a free seminar on cell-aware… Read More
Until now, the integration and testing of IP blocks used in large SOCs has been a manual, time consuming design effort. A new standard called IEEE P1687 (or “IJTAG”) for IP plug-and-play integration is emerging to simplify these tasks. EDA tools are also emerging to support the new standard. Last week mentor announcedTessent IJTAG,… Read More
The goal for automatic test pattern generation (ATPG) is to achieve maximum coverage with the fewest test patterns. This conflicts with the goals of managing power because during test, the IC is often operated beyond its normal functional modes to get the highest quality test results. When switching activity exceeds a device’s… Read More
