Webinar: OCV and Timing Closure Sign-off by Silvaco on Oct 10 at 10AM

Webinar: OCV and Timing Closure Sign-off by Silvaco on Oct 10 at 10AM
by Daniel Nenni on 10-01-2019 at 10:00 am

Image RemovedThe old adage that goes the one constant thing you can always count on is change, could easily be reworded for semiconductor design to say the one constant thing you can count on is variation. This is doubly true. Not only is variation, in all its forms, a constant factor in design, additionally the methods of analyzing… Read More


Crossfire Baseline Checks for Clean IP Part II

Crossfire Baseline Checks for Clean IP Part II
by Daniel Nenni on 10-10-2018 at 7:00 am

In our previous article bearing the same title, we discussed the recommended baseline checks covering cell and pin presence, back-end, and some front-end checks related to functional equivalency. In this article, we’ll cover the extensive list of characterization checks, that include timing arcs, NLDM, CCS, ECSM/EM, and … Read More


We Need Libraries – Lots of Libraries

We Need Libraries – Lots of Libraries
by Tom Simon on 05-08-2017 at 12:00 pm

It was inevitable that machine learning (ML) would come to EDA. In fact, it has already been here a while in Solido’s variation tools. Now it has found an even more compelling application – library characterization. Just as ML has radically transformed other computational arenas; it looks like it will be extremely disruptive here… Read More


Machine Learning Accelerates Library Characterization by 50 Percent!

Machine Learning Accelerates Library Characterization by 50 Percent!
by Daniel Nenni on 04-06-2017 at 7:00 am

Standard cell, memory, and I/O library characterization is a necessary, but time-consuming, resource intensive, and error-prone process. With the added complexity of advanced and low power manufacturing processes, fast and accurate statistical and non-statistical characterization is challenging, creating the need … Read More


Solutions for Variation Analysis at 16nm and Beyond

Solutions for Variation Analysis at 16nm and Beyond
by Tom Simon on 09-22-2016 at 7:00 am

Variation is still the tough nut to crack for advanced process nodes. The familiar refrain of lower operating voltages and higher performance requirements make process variation an extremely important design consideration. As far back as the early 2000’s design teams have been looking for a better approach to model variation… Read More


A Better Way for Analog Designers to Perform Variation Analysis

A Better Way for Analog Designers to Perform Variation Analysis
by Tom Dillinger on 04-18-2016 at 7:00 am

Image RemovedThe impact of process variation at advanced nodes is increasing — no surprise there. In recent years, the principal design emphasis to better reflect this variation has been the adoption of two new methodologies: (1) advanced on-chip variation (AOCV, as well as POCV/LVF) for digital static timing analysis,… Read More


Variation Alphabet Soup

Variation Alphabet Soup
by Paul McLellan on 04-04-2015 at 1:00 pm

Image RemovedOn-chip variation (OCV) is a major issue in timing signoff, especially at low voltages or in 20/16/14nm processes. For example, the graph below shows a 20nm inverter. At 0.6V the inverter has a delay of 2 (nominalized) units. But due to on-chip variation this might be as low as 1.5 units or as high as 3 units, which is a … Read More


Signoff Accurate Timing Analysis at Improved Run-time & Capacity

Signoff Accurate Timing Analysis at Improved Run-time & Capacity
by Pawan Fangaria on 04-18-2014 at 4:30 pm

The semiconductor design sizes, these days, can easily be of the order of several hundred millions of cells, adding into the complexity of verification. Amid ever growing design sizes, it’s a must that the timing verification is done accurately. Normally Static Timing Analysis (STA) is done to check whether all clocks and signals… Read More