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Designers require comprehensive logical, physical, and electrical models to interpret the results of full-chip power noise and electromigration analysis flows, and subsequently deduce the appropriate design updates to address any analysis issues. These models include: LEF, DEF, Liberty library models (including detailed… Read More
It may be hard to believe but this happens to be my thirty third Design Automation Conference. Where does the time go? Three of my kids are out of college and the last one is getting close. That is where my time has gone. The conference itself started in 1964 but my first one was in 1984 in Albuquerque, New Mexico. In fact, that was the year… Read More
